(Invited) Non-Visual Defect Monitoring with Surface Photovoltage Mapping
Findlay, A. D.; Marinskiy, D.; Edelman, P.; Wilson, M.; Savtchouk, A.; Almeida, C.; Lagowski, J.
- 期刊名称ECS Transactions
- 作者Findlay, A. D.; Marinskiy, D.; Edelman, P.; Wilson, M.; Savtchouk, A.; Almeida, C.; Lagowski, J.
- 卷第75卷
- 期第4期
- 印刷ISSN1938-6737
- 电子ISSN1938-5862
- 文件大小1258.66KB
- 发表时间2016-09-23
- DOI10.1149/07504.0013ecst
- 页码13-27