[IEEE 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016 - Ottawa, ON, Canada (2016.7.25-2016.7.29)] 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) - A fast simulation method to measure the circuit nonlinearity
Zhu, Jianfang Olena; Liao, Jun; Norman, Adam; Meltser, Roman
- 作者Zhu, Jianfang Olena; Liao, Jun; Norman, Adam; Meltser, Roman
- 文件大小640.41KB
- 发表时间2016
- DOI10.1109/isemc.2016.7571603
- 页码57-60