SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - Quantum states tomography with noisy measurement channels
Lukichev, Vladimir F.; Rudenko, Konstantin V.; Bogdanov, Yu. I.; Bantysh, B. I.; Bogdanova, N. A.; Kvasnyy, A. B.; Lukichev, V. F.
- 作者Lukichev, Vladimir F.; Rudenko, Konstantin V.; Bogdanov, Yu. I.; Bantysh, B. I.; Bogdanova, N. A.; Kvasnyy, A. B.; Lukichev, V. F.
- 卷第10224卷
- 印刷ISSN0277-786X
- 文件大小1304.55KB
- 发表时间2016
- DOI10.1117/12.2267029