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SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Edinburgh, United Kingdom (Sunday 26 June 2016)] Optical and Infrared Interferometry and Imaging V - The metrology system of the VLTI instrument GRAVITY

SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Edinburgh, United Kingdom (Sunday 26 June 2016)] Optical and Infrared Interferometry and Imaging V - The metrology system of the VLTI instrument GRAVITY

Malbet, Fabien; Creech-Eakman, Michelle J.; Tuthill, Peter G.; Lippa, Magdalena; Gillessen, Stefan; Blind, Nicolas; Kok, Yitping; Yazıcı, Şenol; Weber, Johannes; Pfuhl, Oliver; Haug, Marcus; Kellner, Stefan; Wieprecht, Ekkehard; Eisenhauer, Frank; Genzel, Reinhard; Hans, Oliver; Haußmann, Frank; Huber, David; Kratschmann, Tobias; Ott, Thomas; Plattner, Markus; Rau, Christian; Sturm, Eckhard; Waisberg, Idel; Wiezorrek, Erich; Perrin, Guy; Perraut, Karine; Brandner, Wolfgang; Straubmeier, Christian; Amorim, Antonio
  • 作者Malbet, Fabien; Creech-Eakman, Michelle J.; Tuthill, Peter G.; Lippa, Magdalena; Gillessen, Stefan; Blind, Nicolas; Kok, Yitping; Yazıcı, Şenol; Weber, Johannes; Pfuhl, Oliver; Haug, Marcus; Kellner, Stefan; Wieprecht, Ekkehard; Eisenhauer, Frank; Genzel, Reinhard; Hans, Oliver; Haußmann, Frank; Huber, David; Kratschmann, Tobias; Ott, Thomas; Plattner, Markus; Rau, Christian; Sturm, Eckhard; Waisberg, Idel; Wiezorrek, Erich; Perrin, Guy; Perraut, Karine; Brandner, Wolfgang; Straubmeier, Christian; Amorim, Antonio
  • 卷第9907卷
  • 印刷ISSN0277-786X
  • 文件大小1001.40KB
  • 发表时间2016
  • DOI10.1117/12.2232272
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