SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Edinburgh, United Kingdom (Sunday 26 June 2016)] Optical and Infrared Interferometry and Imaging V - The metrology system of the VLTI instrument GRAVITY
Malbet, Fabien; Creech-Eakman, Michelle J.; Tuthill, Peter G.; Lippa, Magdalena; Gillessen, Stefan; Blind, Nicolas; Kok, Yitping; Yazıcı, Şenol; Weber, Johannes; Pfuhl, Oliver; Haug, Marcus; Kellner, Stefan; Wieprecht, Ekkehard; Eisenhauer, Frank; Genzel, Reinhard; Hans, Oliver; Haußmann, Frank; Huber, David; Kratschmann, Tobias; Ott, Thomas; Plattner, Markus; Rau, Christian; Sturm, Eckhard; Waisberg, Idel; Wiezorrek, Erich; Perrin, Guy; Perraut, Karine; Brandner, Wolfgang; Straubmeier, Christian; Amorim, Antonio
- 作者Malbet, Fabien; Creech-Eakman, Michelle J.; Tuthill, Peter G.; Lippa, Magdalena; Gillessen, Stefan; Blind, Nicolas; Kok, Yitping; Yazıcı, Şenol; Weber, Johannes; Pfuhl, Oliver; Haug, Marcus; Kellner, Stefan; Wieprecht, Ekkehard; Eisenhauer, Frank; Genzel, Reinhard; Hans, Oliver; Haußmann, Frank; Huber, David; Kratschmann, Tobias; Ott, Thomas; Plattner, Markus; Rau, Christian; Sturm, Eckhard; Waisberg, Idel; Wiezorrek, Erich; Perrin, Guy; Perraut, Karine; Brandner, Wolfgang; Straubmeier, Christian; Amorim, Antonio
- 卷第9907卷
- 印刷ISSN0277-786X
- 文件大小1001.40KB
- 发表时间2016
- DOI10.1117/12.2232272