发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2016 IEEE 16th International Conference on Data Mining Workshops (ICDMW) - Barcelona, Spain (2016.12.12-2016.12.15)] 2016 IEEE 16th International Conference on Data Mining Workshops (ICDMW) - Will I Get in? Modeling the Graduate Admission Process for American Universities

[IEEE 2016 IEEE 16th International Conference on Data Mining Workshops (ICDMW) - Barcelona, Spain (2016.12.12-2016.12.15)] 2016 IEEE 16th International Conference on Data Mining Workshops (ICDMW) - Will I Get in? Modeling the Graduate Admission Process for American Universities

Gupta, Narender; Sawhney, Aman; Roth, Dan

作者Gupta, Narender; Sawhney, Aman; Roth, Dan
文件大小231.88KB
发表时间2016
DOI10.1109/ICDMW.2016.0095
页码631-638

← 返回【学霸图书馆】主页