SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices - Optical properties of thermally evaporated ultra-thin Al, Ag and Cu films
Jiang, Yadong; Kippelen, Bernard; Yu, Junsheng; Zhou, Ming; Li, Yaopeng; Zhou, Sheng; Zhang, Li; Cai, Yuan; Liu, Dingquan
- 作者Jiang, Yadong; Kippelen, Bernard; Yu, Junsheng; Zhou, Ming; Li, Yaopeng; Zhou, Sheng; Zhang, Li; Cai, Yuan; Liu, Dingquan
- 卷第9686卷
- 印刷ISSN0277-786X
- 文件大小1617.45KB
- 发表时间2016
- DOI10.1117/12.2242251