SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - Analysis of wave optics BRDF model elements for a moderately rough surface
- 作者Hanssen, Leonard M.; Freda, Samuel E.; Butler, Samuel D.; Nauyoks, Stephen E.; Marciniak, Michael A.
- 卷第9961卷
- 印刷ISSN0277-786X
- 文件大小738.72KB
- 发表时间2016
- DOI10.1117/12.2238118
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