[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Increased accuracy of microwave transistor S-parameters measurements
- 作者Ryasnyi, Yu. V.; Chashkov, M. S.
- 文件大小479.66KB
- 发表时间2016
- DOI10.1109/APEIE.2016.7802248
- 页码186-188
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