[IEEE 2016 17th International Conference on Sciences and Techniques of Automatic Control and Computer Engineering (STA) - Sousse, Tunisia (2016.12.19-2016.12.21)] 2016 17th International Conference on Sciences and Techniques of Automatic Control and Computer Engineering (STA) - 3D face recognition using local binary pattern and grey level co-occurrence matrix
Yahia, Samah; Ben Salem, Yassine; Abdelkrim, Mohamed Naceur
- 作者Yahia, Samah; Ben Salem, Yassine; Abdelkrim, Mohamed Naceur
- 文件大小705.26KB
- 发表时间2016
- DOI10.1109/STA.2016.7952047
- 页码328-338