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[IEEE IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Florence, Italy (2016.10.23-2016.10.26)] IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Ringing frequency extraction for health monitoring of power transistors

[IEEE IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Florence, Italy (2016.10.23-2016.10.26)] IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Ringing frequency extraction for health monitoring of power transistors

Lei Ren, ; Qian Shen, ; Chunying Gong,
  • 作者Lei Ren, ; Qian Shen, ; Chunying Gong,
  • 文件大小1486.70KB
  • 发表时间2016
  • DOI10.1109/IECON.2016.7793387
  • 页码447-452
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