Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors

• 期刊名称AIP Advances
• 作者Wang, Zujun; Ma, Wuying; Huang, Shaoyan; Yao, Zhibin; Liu, Minbo; He, Baoping; Liu, Jing; Sheng, Jiangkun; Xue, Yuan
• 卷第6卷
• 期第3期
• 电子ISSN2158-3226
• 文件大小3114.10KB
• 发表时间2016-03
• DOI10.1063/1.4943674