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[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Total ionizing dose sensitivity of a radiation-tolerant phase-locked loop in a 130 nm SOI technology

[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Total ionizing dose sensitivity of a radiation-tolerant phase-locked loop in a 130 nm SOI technology

Chen, Zhuojun; Lin, Min; Ding, Ding; Zheng, Yunlong; Sang, Zehua; Zou, Shichang; Chen, Rongmei
  • 作者Chen, Zhuojun; Lin, Min; Ding, Ding; Zheng, Yunlong; Sang, Zehua; Zou, Shichang; Chen, Rongmei
  • 文件大小600.61KB
  • 发表时间2016
  • DOI10.1109/radecs.2016.8093117
  • 页码1-5
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