![[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX, USA (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Addressable test structure design enabling parallel testing of reliability devices]()
[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX, USA (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Addressable test structure design enabling parallel testing of reliability devicesDeBruler, Lee; Pretti, Dennis; Violette, Mike; Peterson, Dave; Mujumdar, Salil; Li, Xia; Marr, Ken · 2018