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Psychometric Properties of the BIS/BAS Scales and the SPSRQ in Flemish Adolescents

Psychometric Properties of the BIS/BAS Scales and the SPSRQ in Flemish Adolescents

Vandeweghe, Laura; Matton, Annelies; Beyers, Wim; Vervaet, Myriam; Braet, Caroline; Goossens, Lien
  • 期刊名称Psychologica Belgica
  • 作者Vandeweghe, Laura; Matton, Annelies; Beyers, Wim; Vervaet, Myriam; Braet, Caroline; Goossens, Lien
  • 卷第56卷
  • 期第4期
  • 印刷ISSN0033-2879
  • 电子ISSN2054-670X
  • 文件大小481.36KB
  • 发表时间2016-12-20
  • DOI10.5334/pb.298
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