Evolution of grain structure and recombination active dislocations in extraordinary tall conventional and high performance multi-crystalline silicon ingots
Trempa, M.; Kupka, I.; Kranert, C.; Lehmann, T.; Reimann, C.; Friedrich, J.
- 期刊名称Journal of Crystal Growth
- 作者Trempa, M.; Kupka, I.; Kranert, C.; Lehmann, T.; Reimann, C.; Friedrich, J.
- 卷第459卷
- 印刷ISSN0022-0248
- 文件大小1266.29KB
- 发表时间2017-02
- DOI10.1016/j.jcrysgro.2016.11.030
- 页码67-75