Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs
Balanethiram, Suresh; D'Esposito, Rosario; Chakravorty, Anjan; Fregonese, Sebastien; Zimmer, Thomas
- 期刊名称IEEE Transactions on Electron Devices
- 作者Balanethiram, Suresh; D'Esposito, Rosario; Chakravorty, Anjan; Fregonese, Sebastien; Zimmer, Thomas
- 卷第64卷
- 期第3期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1357.80KB
- 发表时间2017-3
- DOI10.1109/TED.2016.2645615
- 页码1380-1384