High-Yield and Robust 9T SRAM Cell Tolerant to Removal of Metallic Carbon Nanotubes
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Sun, Yanan; He, Weifeng; Mao, Zhigang; Jiao, Hailong; Kursun, Volkan
- 卷第17卷
- 期第1期
- 印刷ISSN1530-4388
- 电子ISSN1558-2574
- 文件大小647.34KB
- 发表时间2017-3
- DOI10.1109/TDMR.2017.2668761
- 页码20-31
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