Volterra Series-Based Time-Domain Macromodeling of Nonlinear Circuits
- 期刊名称IEEE Transactions on Components, Packaging and Manufacturing Technology
- 作者Xiong, Xiaoyan Y. Z.; Jiang, Li Jun; Schutt-Aine, Jose E.; Chew, Weng Cho
- 卷第7卷
- 期第1期
- 印刷ISSN2156-3950
- 电子ISSN2156-3985
- 文件大小2639.48KB
- 发表时间2017-1
- DOI10.1109/tcpmt.2016.2627601
- 页码39-49
[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Biographies2016
[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Preface2016
[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - WorkshopsShuto, Susumo · 2016
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