A Community Checklist for Health Sector Resilience Informed by Hurricane Sandy
- 期刊名称Health Security
- 作者Toner, Eric S.; McGinty, Meghan; Schoch-Spana, Monica; Rose, Dale A.; Watson, Matthew; Echols, Erin; Carbone, Eric G.
- 卷第15卷
- 期第1期
- 印刷ISSN2326-5094
- 电子ISSN2326-5108
- 文件大小607.87KB
- 发表时间2017-02
- DOI10.1089/hs.2016.0079
- 页码53-69
Confirmation of information transfer using lattice imagesAkashi, Tetsuya; Sugawara, Akira; Kasai, Hiroto; Yoshida, Takaho; Matsuda, Tsuyoshi; Togawa, Yoshihiko; Harada, Ken; Tonomura, Akira · Applied Physics Letters · 2005
Direct observation of rectified motion of vortices by Lorentz microscopyYoshihiko Togawa; Ken Harada; Tetsuya Akashi; Hiroto Kasai; Tsuyoshi Matsuda; Atsutaka Maeda; Akira Tonomura · 2006
Direct Observation of Rectified Motion of Vortices in a Niobium SuperconductorTogawa, Yoshihiko; Harada, Ken; Akashi, Tetsuya; Kasai, Hiroto; Matsuda, Tsuyoshi; Nori, Franco; Maeda, Atsutaka; Tonomura, Akira · Physical Review Letters · 2005
Rectified motion of vortices in a niobium superconductor observed by Lorentz microscopyYoshihiko Togawa; Ken Harada; Tetsuya Akashi; Hiroto Kasai; Tsuyoshi Matsuda; Atsutaka Maeda; Akira Tonomura · 2005
Record number (11 000) of interference fringes obtained by a 1 MV field-emission electron microscopeAkashi, Tetsuya; Harada, Ken; Matsuda, Tsuyoshi; Kasai, Hiroto; Tonomura, Akira; Furutsu, Tadao; Moriya, Noboru; Yoshida, Takaho; Kawasaki, Takeshi; Kitazawa, Koichi; Koinuma, Hideomi · Applied Physics Letters · 2002
Characterization of Dynamics in Materials Using Time-Resolved Electron Microscopy Incorporating Electron Counting and Electron Correlation SpectroscopyNobuyuki Osakabe; Hiroto Kasai; Ken Harada; Mark I. Lutwyche; Akira Tonomura · 1999
Real-Time Observation of the Interaction between Flux Lines and Defects in a Superconductor by Lorentz MicroscopyHarada, Ken; Kasai, Hiroto; Matsuda, Tsuyoshi; Yamasaki, Masami; Bonevich, John E.; Tonomura, Akira · Japanese Journal of Applied Physics · 1994
Image analysis and simulation software in transmission electron microscopyStadelmann, P · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 2003
Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006
Scientific ProgramMicroscopy and Microanalysis · 2008
Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009
Trichomonads under MicroscopyBenchimol, Marlene · Microscopy and Microanalysis · 2004
Electron Microscopic Studies with GrapheneMeyer, J; Chuvilin, A; Kaiser, U · Microscopy and Microanalysis · 2009
Stress Whitening Morphology of Multiphase PolypropyleneWestphal, S · Microscopy and Microanalysis · 2006
Aberration-Corrected Lorentz MicroscopyNuhfer, NT; Budruk, A; De Graef, M · Microscopy and Microanalysis · 2010