Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65 nm CMOS

Mitrovic, Mladen; Hofbauer, Michael; Goll, Bernhard; Schneider-Hornstein, Kerstin; Swoboda, Robert; Steindl, Bernhard; Voss, Kay-Obbe; Zimmermann, Horst

期刊名称IEEE Transactions on Nuclear Science
作者Mitrovic, Mladen; Hofbauer, Michael; Goll, Bernhard; Schneider-Hornstein, Kerstin; Swoboda, Robert; Steindl, Bernhard; Voss, Kay-Obbe; Zimmermann, Horst
印刷ISSN0018-9499
电子ISSN1558-1578
文件大小637.77KB
发表时间2017
DOI10.1109/TNS.2017.2672820
页码1-1

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Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65 nm CMOS