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Open-Circuit IGBT Fault Detection and Location Isolation for Cascaded Multilevel Converters

Open-Circuit IGBT Fault Detection and Location Isolation for Cascaded Multilevel Converters

Lamb, Jacob; Mirafzal, Behrooz
  • 期刊名称IEEE Transactions on Industrial Electronics
  • 作者Lamb, Jacob; Mirafzal, Behrooz
  • 印刷ISSN0278-0046
  • 电子ISSN1557-9948
  • 文件大小3675.26KB
  • 发表时间2017
  • DOI10.1109/TIE.2017.2674629
  • 页码1-1
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