A Word Line Pulse Circuit Technique for Reliable Magnetoelectric Random Access Memory
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Lee, Hochul; Lee, Albert; Wang, Shaodi; Ebrahimi, Farbod; Gupta, Puneet; Amiri, Pedram Khalili; Wang, Kang L.
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小4126.53KB
- 发表时间2017
- DOI10.1109/TVLSI.2017.2670502
- 页码1-8
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