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[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Handling manufacturing and aging faults with software-based techniques in tiny embedded systems

[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Handling manufacturing and aging faults with software-based techniques in tiny embedded systems

Muhlbauer, Felix; Schroder, Lukas; Skoncej, Patryk; Scholzel, Mario

作者Muhlbauer, Felix; Schroder, Lukas; Skoncej, Patryk; Scholzel, Mario
文件大小703.17KB
发表时间2017
DOI10.1109/LATW.2017.7906756
页码1-6

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