SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - 3D geometrical characterization and modelling of solid oxide cells electrodes microstructure by image analysis
- 作者Nagahara, Hajime; Umeda, Kazunori; Yamashita, Atsushi; Moussaoui, H.; Debayle, J.; Gavet, Y.; Delette, G.; Hubert, M.; Cloetens, P.; Laurencin, J.
- 卷第10338卷
- 印刷ISSN0277-786X
- 文件大小744.81KB
- 发表时间2017
- DOI10.1117/12.2264376
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