Analysis of surface insulation resistance related failures in electronics by circuit simulation
- 期刊名称Circuit World
- 作者Verdingovas, Vadimas; Joshy, Salil; Jellesen, Morten Stendahl; Ambat, Rajan
- 卷第43卷
- 期第2期
- 印刷ISSN0305-6120
- 文件大小1263.05KB
- 发表时间2017-05-02
- DOI10.1108/CW-09-2016-0040
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