A prognostic method for predicting failure of dc/dc converter

• 期刊名称Microelectronics Reliability
• 作者Qingchuan, He; Wenhua, Chen; Jun, Pan; Ping, Qian
• 卷第74卷
• 印刷ISSN0026-2714
• 文件大小2745.69KB
• 发表时间2017-07
• DOI10.1016/j.microrel.2017.05.014
• 页码27-33