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[ACM Press the 2017 ACM SIGMETRICS / International Conference - Urbana-Champaign, Illinois, USA (2017.06.05-2017.06.09)] Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems  - SIGMETRICS '17 Abstracts - ECF

[ACM Press the 2017 ACM SIGMETRICS / International Conference - Urbana-Champaign, Illinois, USA (2017.06.05-2017.06.09)] Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems - SIGMETRICS '17 Abstracts - ECF

Lim, Yeon-sup; Nahum, Erich M.; Towsley, Don; Gibbens, Richard J.
  • 作者Lim, Yeon-sup; Nahum, Erich M.; Towsley, Don; Gibbens, Richard J.
  • 文件大小1110.65KB
  • 发表时间2017
  • DOI10.1145/3078505.3078552
  • 页码33-34
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