[ACM Press the 2017 ACM SIGMETRICS / International Conference - Urbana-Champaign, Illinois, USA (2017.06.05-2017.06.09)] Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems - SIGMETRICS '17 Abstracts - ECF
Lim, Yeon-sup; Nahum, Erich M.; Towsley, Don; Gibbens, Richard J.
- 作者Lim, Yeon-sup; Nahum, Erich M.; Towsley, Don; Gibbens, Richard J.
- 文件大小1110.65KB
- 发表时间2017
- DOI10.1145/3078505.3078552
- 页码33-34