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Partition-based approach to parametric dynamic compact thermal modeling

Codecasa, Lorenzo; d’Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò; Metzger, Andre G.; Bornoff, Robin; Parry, John

期刊名称Microelectronics Reliability
作者Codecasa, Lorenzo; d’Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò; Metzger, Andre G.; Bornoff, Robin; Parry, John
印刷ISSN0026-2714
文件大小3775.57KB
发表时间2017-7
DOI10.1016/j.microrel.2017.06.059