[IEEE 2017 International Conference on Noise and Fluctuations (ICNF) - Vilnius, Lithuania (2017.6.20-2017.6.23)] 2017 International Conference on Noise and Fluctuations (ICNF) - Statistical analysis of 1/f noise in enclosed-gate N- and PMOS transistors
Nikolaou, Aristeidis; Mavredakis, Nikolaos; Bucher, Matthias; Habas, Predrag; Acovic, Alexandre; Meyer, Rene
- 作者Nikolaou, Aristeidis; Mavredakis, Nikolaos; Bucher, Matthias; Habas, Predrag; Acovic, Alexandre; Meyer, Rene
- 文件大小1429.79KB
- 发表时间2017
- DOI10.1109/ICNF.2017.7986018
- 页码1-4