Output-Capacitor-Free LDO Design Methodologies for High EMI Immunity
Joo, Soyeon; Kim, SoYoung
- 期刊名称IEEE Transactions on Electromagnetic Compatibility
- 作者Joo, Soyeon; Kim, SoYoung
- 印刷ISSN0018-9375
- 电子ISSN1558-187X
- 文件大小1321.88KB
- 发表时间2017
- DOI10.1109/TEMC.2017.2727047
- 页码1-10