Qualitative XANES and XPS Analysis of Substrate Effects in VO
<sub/>2</sub>
Thin Films: A Route to Improving Chemical Vapour Deposition Synthetic Methods?

Qualitative XANES and XPS Analysis of Substrate Effects in VO ₂ Thin Films: A Route to Improving Chemical Vapour Deposition Synthetic Methods?

Powell, Michael J.; Godfrey, Ian James; Quesada-Cabrera, Raul; Malarde, Delphine; Teixeira, Diana; Emerich, Hermann; Palgrave, Robert G.; Carmalt, Claire J.; Parkin, Ivan P.; Sankar, Gopinathan

期刊名称The Journal of Physical Chemistry C
作者Powell, Michael J.; Godfrey, Ian James; Quesada-Cabrera, Raul; Malarde, Delphine; Teixeira, Diana; Emerich, Hermann; Palgrave, Robert G.; Carmalt, Claire J.; Parkin, Ivan P.; Sankar, Gopinathan
印刷ISSN1932-7447
电子ISSN1932-7455
文件大小2299.08KB
发表时间2017-08-24
DOI10.1021/acs.jpcc.7b06044

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Qualitative XANES and XPS Analysis of Substrate Effects in VO 2 Thin Films: A Route to Improving Chemical Vapour Deposition Synthetic Methods?

Qualitative XANES and XPS Analysis of Substrate Effects in VO ₂ Thin Films: A Route to Improving Chemical Vapour Deposition Synthetic Methods?