Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements
Giusi, G.; Sarnelli, E.; Barra, M.; Cassinese, A.; Scandurra, G.; Nakayama, K.; Ciofi, C.
- 期刊名称IEEE Transactions on Electron Devices
- 作者Giusi, G.; Sarnelli, E.; Barra, M.; Cassinese, A.; Scandurra, G.; Nakayama, K.; Ciofi, C.
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1231.43KB
- 发表时间2017
- DOI10.1109/TED.2017.2738699
- 页码1-6