Combining ray tracing with device modeling to evaluate experiments for an optical analysis of crystalline Si solar cells and modules

Yang, Yang; Liu, Ruimin; McIntosh, Keith R.; Abbott, Malcolm; Sudbury, Ben; Holovsky, Jakub; Ye, Feng; Deng, Weiwei; Feng, Zhiqiang; Verlinden, Pierre J.; Altermatt, Pietro P.

期刊名称Energy Procedia
作者Yang, Yang; Liu, Ruimin; McIntosh, Keith R.; Abbott, Malcolm; Sudbury, Ben; Holovsky, Jakub; Ye, Feng; Deng, Weiwei; Feng, Zhiqiang; Verlinden, Pierre J.; Altermatt, Pietro P.
卷第124卷
印刷ISSN1876-6102
文件大小1283.77KB
发表时间2017-09
DOI10.1016/j.egypro.2017.09.269
页码240-249

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Combining ray tracing with device modeling to evaluate experiments for an optical analysis of crystalline Si solar cells and modules