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Comparing the degradation effect of a ‘two-cell’ Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests

Comparing the degradation effect of a ‘two-cell’ Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests

Ahmad Abubakar, Hadiza; Isa, Dino; Wan, Wong Yee
  • 期刊名称Microelectronics Reliability
  • 作者Ahmad Abubakar, Hadiza; Isa, Dino; Wan, Wong Yee
  • 卷第79卷
  • 印刷ISSN0026-2714
  • 文件大小1918.55KB
  • 发表时间2017-12
  • DOI10.1016/j.microrel.2017.10.025
  • 页码140-148
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