Comparing the degradation effect of a ‘two-cell’ Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests
Ahmad Abubakar, Hadiza; Isa, Dino; Wan, Wong Yee
期刊名称Microelectronics Reliability
作者Ahmad Abubakar, Hadiza; Isa, Dino; Wan, Wong Yee