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Modeling and simulation of the charge trapping component of BTI and RTS

Modeling and simulation of the charge trapping component of BTI and RTS

Both, Thiago Hanna; Firpo Furtado, Gabriela; Wirth, Gilson Inacio

期刊名称Microelectronics Reliability
作者Both, Thiago Hanna; Firpo Furtado, Gabriela; Wirth, Gilson Inacio
印刷ISSN0026-2714
文件大小1552.63KB
发表时间2017-11
DOI10.1016/j.microrel.2017.11.009

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