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Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

Sunaoshi, Takeshi; Okada, Satoshi; Kaji, Kazutoshi; Voelkl, Edgar; Ramachandran, Roshini; Salguero, Tina
  • 期刊名称Microscopy and Microanalysis
  • 作者Sunaoshi, Takeshi; Okada, Satoshi; Kaji, Kazutoshi; Voelkl, Edgar; Ramachandran, Roshini; Salguero, Tina
  • 卷第23卷
  • 印刷ISSN1431-9276
  • 电子ISSN1435-8115
  • 文件大小7986.46KB
  • 发表时间2017-07
  • DOI10.1017/s1431927617009813
  • 页码1830-1831
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