![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Simple setup for optical characterization of microlenses]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Simple setup for optical characterization of microlensesFurlong, Cosme; Gorecki, Christophe; de Groot, Peter J.; Novak, Erik L.; Perrin, Stephane; Baranski, Maciej; Passilly, Nicolas; Froehly, Luc; Albero, Jorge; Bargiel, Sylwester; Gorecki, Christophe · 2014