Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity

• 期刊名称IEEE Transactions on Electron Devices
• 作者Balanethiram, Suresh; Chakravorty, Anjan; D'Esposito, Rosario; Fregonese, Sebastien; Celi, Didier; Zimmer, Thomas
• 卷第64卷
• 期第9期
• 印刷ISSN0018-9383
• 电子ISSN1557-9646
• 文件大小1123.80KB
• 发表时间2017-9
• DOI10.1109/TED.2017.2724939
• 页码3955-3960