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[IEEE 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Riga, Latvia (2017.11.24-2017.11.25)] 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technology

[IEEE 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Riga, Latvia (2017.11.24-2017.11.25)] 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technology

Macaitis, V.; Navickas, R.

作者Macaitis, V.; Navickas, R.
文件大小294.36KB
发表时间2017
DOI10.1109/AIEEE.2017.8270549
页码1-4

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