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[IEEE 2017 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium ((EFTF/IFC) - BESANÇON, France (2017.7.9-2017.7.13)] 2017 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFC) - Noise sources characterization and its compact modeling based on physical device simulations for designing low phase noise oscillators

[IEEE 2017 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium ((EFTF/IFC) - BESANÇON, France (2017.7.9-2017.7.13)] 2017 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFC) - Noise sources characterization and its compact modeling based on physical device simulations for designing low phase noise oscillators

Nallatamby, Jean-Christophe; Prigent, Michel; Cordeau, David; Paillot, Jean-Marie
  • 作者Nallatamby, Jean-Christophe; Prigent, Michel; Cordeau, David; Paillot, Jean-Marie
  • 文件大小162.38KB
  • 发表时间2017
  • DOI10.1109/FCS.2017.8088837
  • 页码175-175
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