[IEEE NAECON 2017 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - A signal processing and data analysis technique for accurate extraction and estimation of FTIR signal aberrations in microsphere-lens-enhanced MWIR photo detectors via system transfer functions mathematical modeling
Megherbi, D. B.; DiZoglio, J.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A.
- 作者Megherbi, D. B.; DiZoglio, J.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A.
- 文件大小1933.17KB
- 发表时间2017
- DOI10.1109/NAECON.2017.8268768
- 页码193-198