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[IEEE NAECON 2017 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - A signal processing and data analysis technique for accurate extraction and estimation of FTIR signal aberrations in microsphere-lens-enhanced MWIR photo detectors via system transfer functions mathematical modeling

[IEEE NAECON 2017 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - A signal processing and data analysis technique for accurate extraction and estimation of FTIR signal aberrations in microsphere-lens-enhanced MWIR photo detectors via system transfer functions mathematical modeling

Megherbi, D. B.; DiZoglio, J.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A.
  • 作者Megherbi, D. B.; DiZoglio, J.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A.
  • 文件大小1933.17KB
  • 发表时间2017
  • DOI10.1109/NAECON.2017.8268768
  • 页码193-198
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