![[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Design and testing of CMOS compatible EEPROM]()
[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Design and testing of CMOS compatible EEPROMYin, Haibin; Peng, Xiaohong; Wan, Peiyuan; Wang, Jinhui; Hou, Ligang · 2015