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[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - A measurement method to extract the transient junction temperature profile of power semiconductors at surge conditions

[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - A measurement method to extract the transient junction temperature profile of power semiconductors at surge conditions

Du, Yu; Rodrigues, Rostan; Jiang, Taosha
  • 作者Du, Yu; Rodrigues, Rostan; Jiang, Taosha
  • 文件大小699.23KB
  • 发表时间2017
  • DOI10.1109/ECCE.2017.8096479
  • 页码2512-2519
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