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On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor

On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor

Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.; Filippov, M. N.
  • 期刊名称Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
  • 作者Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.; Filippov, M. N.
  • 卷第11卷
  • 期第5期
  • 印刷ISSN1027-4510
  • 电子ISSN1819-7094
  • 文件大小475.95KB
  • 发表时间2017-9
  • DOI10.1134/S1027451017050147
  • 页码981-986
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