On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor
Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.; Filippov, M. N.
- 期刊名称Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
- 作者Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.; Filippov, M. N.
- 卷第11卷
- 期第5期
- 印刷ISSN1027-4510
- 电子ISSN1819-7094
- 文件大小475.95KB
- 发表时间2017-9
- DOI10.1134/S1027451017050147
- 页码981-986