Effects of Liner Thickness on the Reliability of AgTe/TiO
2
-Based Threshold Switching Devices
Song, Jeonghwan; Woo, Jiyong; Yoo, Jongmyung; Chekol, Solomon Amsalu; Lim, Seokjae; Sung, Changhyuck; Hwang, Hyunsang
- 期刊名称IEEE Transactions on Electron Devices
- 作者Song, Jeonghwan; Woo, Jiyong; Yoo, Jongmyung; Chekol, Solomon Amsalu; Lim, Seokjae; Sung, Changhyuck; Hwang, Hyunsang
- 卷第64卷
- 期第11期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1163.50KB
- 发表时间2017-11
- DOI10.1109/TED.2017.2747589
- 页码4763-4767