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[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - LOTS about attacking deep features

[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - LOTS about attacking deep features

Rozsa, Andras; Gunther, Manuel; Boult, Terranee E.

作者Rozsa, Andras; Gunther, Manuel; Boult, Terranee E.
文件大小1029.64KB
发表时间2017
DOI10.1109/BTAS.2017.8272695
页码168-176

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