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[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Scalable methods of discrete plant model generation for closed-loop model checking

[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Scalable methods of discrete plant model generation for closed-loop model checking

Buzhinsky, Igor; Pakonen, Antti; Vyatkin, Valeriy
  • 作者Buzhinsky, Igor; Pakonen, Antti; Vyatkin, Valeriy
  • 文件大小197.76KB
  • 发表时间2017
  • DOI10.1109/iecon.2017.8216949
  • 页码5483-5488
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