[IEEE 2017 20th International Multi-topic Conference (INMIC) - Lahore (2017.11.24-2017.11.26)] 2017 International Multi-topic Conference (INMIC) - Multitone measurement system for linearity investigations of microwave devices
Chaudhary, Muhammad Akmal; Memon, Zulfiqar Ali; Lees, Jonathan; Benedikt, Johannes; Tasker, Paul
- 作者Chaudhary, Muhammad Akmal; Memon, Zulfiqar Ali; Lees, Jonathan; Benedikt, Johannes; Tasker, Paul
- 文件大小474.41KB
- 发表时间2017
- DOI10.1109/INMIC.2017.8289455
- 页码1-4