[IEEE 2017 IEEE Innovative Smart Grid Technologies - Asia (ISGT-Asia) - Auckland, New Zealand (2017.12.4-2017.12.7)] 2017 IEEE Innovative Smart Grid Technologies - Asia (ISGT-Asia) - Fault identification in AC and DC systems using stft analysis of high frequency components
- 作者Ukil, Abhisek; Yeap, Yew Ming; Satpathi, Kuntal; Geddada, Nagesh
- 文件大小3081.26KB
- 发表时间2017
- DOI10.1109/ISGT-Asia.2017.8378463
- 页码1-6
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