![CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications]()
CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applicationsShahidi, G. G.; Warnock, J. D.; Comfort, J.; Fischer, S.; McFarland, P. A.; Acovic, A.; Chappell, T. I.; Chappell, B. A.; Ning, T. H.; Anderson, C. J.; Dennard, R. H.; Sun, J. Y.-C.; Polcari, M. R.; Davari, B. · IBM Journal of Research and Development · 1995